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China Semiconductor Discrete Device Static Parameter Test System - China Supplier
China Semiconductor Discrete Device Static Parameter Test System - China Supplier China Semiconductor Discrete Device Static Parameter Test System - China Supplier China Semiconductor Discrete Device Static Parameter Test System - China Supplier China Semiconductor Discrete Device Static Parameter Test System - China Supplier China Semiconductor Discrete Device Static Parameter Test System - China Supplier

Semiconductor Discrete Device Static Parameter Test System

Price:¥1
Industry Category: Others
Product Category:
Brand: 華科智源
Spec: HUSTEC-DC-2010


Contact Info
  • Add:深圳市寶安區(qū)西鄉(xiāng)街道智慧創(chuàng)新中心, Zip: 518102
  • Contact: 陳先生
  • Tel:13008867918
  • Email:chensl@hustec.cn

Other Products

Description
Additional Information

Product Introduction  

The product features a desktop structure designed for placement on a workbench, consisting of two main components: the test host and the programmable computer. It supports external fixtures and adapters and can optionally connect to sorting machines and robotic arms via Prober and Handler interfaces (16Bin) to establish a workstation for rapid batch testing. Through software configuration, it can automatically classify and store devices based on their parameter grades. It is highly suitable for various scenarios such as "Incoming Quality Control," "Failure Analysis," "Selection and Matching," and "Mass Production Testing." 

The product demonstrates excellent performance in reliability, repeatability of test data, and testing efficiency. The innovative "point-control fixture" allows operators to perform tests with a single touch on the fixture, making operations simpler and more efficient. Test data can be saved as Excel files.

Application Scenarios

Testing and Analysis (Initial testing during the R&D and design phase of power devices) 

Failure Analysis (Testing and analyzing failed devices to identify failure mechanisms, enabling improvements in the overall design and usage process of electronic systems) 

Selection and Matching (Conducting comprehensive testing before devices are soldered onto circuit boards, classifying and pairing devices with consistent test data) 

Incoming Quality Control (Sampling or full inspection of incoming devices by quality departments (IQC) in research institutes and electronics factories to ensure device yield rates) 

Mass Production Testing (Can connect to various auxiliary equipment such as robotic arms, barcode scanners, and sorting machines to achieve large-scale, automated testing)


Industry Category Others
Product Category
Brand: 華科智源
Spec: HUSTEC-DC-2010
Stock:
Origin: China / Guangdong / Shenshi
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