Scanning Electron Microscope Calibration
Price:￥5000
/臺(tái)
Contact Info
- Add:廣東省深圳市南山區(qū)西麗街道陽(yáng)光社區(qū)松白路1008號(hào)港鴻基高新智能產(chǎn)業(yè)園B棟103, Zip: 518000
- Contact: 吳新輝
- Tel:13530743695
- Email:13530743695@163.com
Other Products
Description
Additional Information
Scanning Electron Microscope Calibration Specification:
"Scanning Electron Microscope Calibration Specification JJF 1916", "Analytical Scanning Electron Microscope Verification Regulation JJG (Education Commission) 010"
Instrument Calibration Parameters:
1) Magnification
10X~50000X, 50000X~300000X, 300000X~1000000X
2) Length
100nm~500nm, 500nm~1μm, 1μm~10μm
3) Electron Energy
(125~155) eV
4) Content
(0.1~100)%
5) Angle
(0～360)°
| Industry Category | |
|---|---|
| Product Category | |
| Brand: | 廣電計(jì)量檢測(cè)集團(tuán)股份有限公司 |
| Spec: | 掃描電子顯微鏡校準(zhǔn)規(guī)范 JJF 1916 |
| Stock: | 100000 |
| Manufacturer: | |
| Origin: | China / Guangdong / Shenshi |
